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FD8
: APPLIED PHYSICS
UNIT – I
Interference,
Interference of wave , Interference due to thin films of uniform
thickness, Interference due to thin films of non-uniform thickness,
Newton’s ring, Michelson’s Interferometer, Engineering applications
of Interference, Relativity, Relativity of mass: Time dilation,
length contraction, mass and energy, Doppler’s effect.
UNIT-II
A.
DIFFRACTION
Diffraction
of wave, Classes of diffraction, Fraunhoffer diffraction at a single
slit, Condition for maxima and minima, Diffraction at a circular
operature, Plane diffraction grating, Conditions for Principle
maxima and minima , Resolving Power, Ray leigh’s Criterion for
resolution of two Point objects, R.P of grating, R.P at Telescope,
X-ray diffraction, Law spots, Bragg’s Law, Bragg’s X-ray
spectrometer,
B.
ULTRASONICS
Ultrasonic
waves, Piezo electric effect,Production of U.Waves by P. electric,
Magnetostriction effect, Production of U. Waves and its uses, Flow
detection.
C.
POLARISATION
Polarisation
by reflection, Brewster’s law, Double refraction, Positive and
negative crystal , Nieol Prism, Law of Malus, Elliptical and
Circular Polarisation, Quarter and half wave Plates, Production of
Polarised light, analysis of light.
D. NUCLEAR
PHYSICS
UNIT-III.
A.WAVE
PARTICLE QUALITY
Concept of
group velocity, Phase velocity, Wave nature of matter, De- broglie
waves, Derivation of De-broglies formula by analogy with radiation.
Wave length of matter waves, Electron diffraction, Davisson and
Germer’s experiment, Heisenberg uncertainity.
B. WAVE
EQUATION
Concept of
wave function and probability interpretation, Schrodinger’s time
–dependent and time independent wave equations, Physical
significance of wave function, Application of Schrödinger’s time-
independent wave equation, Tunneling effect, Tunnel Diode.
UNIT-IV
A. LASER
B.MAGNETISM
UNIT-V
A.
SEMICONDUCTOR PHYSICS
B. MODERN
PHYSICS
Motion of an
electron in electric and magnetic field, Specific charge of an
electron, electrostatic and magnetostatic focusing, Electron
microscope, Bainbridge mass spectrograph, Positive ray, Scanning
electron microscope.
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